PRECONDITION TEST
DESCRIPTION OF TEST EQUIPMENT
| Test Equipment |
Model |
Serial Number |
Calibration Date |
SAT microscope |
Sonix USA UHR2001 |
200352-06/478 |
NA |
Temperature Chamber |
SHINRON HTKR-1000 |
-- |
May 07, 2008 |
Temp./Humidity Chamber |
KSON THS-B 4C -150 |
2781 |
May 07, 2008 |
Reflow |
FOLUNGWIN FL-VP860N |
B1-7326 |
Aug 21, 2008 |
|
LABORATORY AMBIENCE CONDITION
Temperature: 25 ¡Ó 5 ¢J
Relative humidity: 55% ¡Ó 20% (RH)
REFERENCE DOCUMENT
The test refers to IPC/EIA J-STD-020D Test Method
TEST CONDITION
Procedure 1: SAT 1
Procedure 2: Bake
Temperature: 125 ¢J
Test Time: 24 hours
Procedure 3: Soak
Temperature: 85 ¢J
Humidity: 85% RH
Test Time: 168 hours
Procedure 4: Reflow
Profile Feature |
Convection |
Average ramp-up rate ( 200 ¢J to Peak) |
3 ¢J /second |
Preheat temperature 175 ( ¡Ó 25) ¢J |
60-120 seconds |
Temperature maintained above 217 ¢J |
60-150 seconds |
Time within 5 ¢J of actual peak temperature |
30 seconds min. |
Peak temperature range |
(260 ¡Ó 2) ¢J |
Ramp-down rate |
6 ¢J /second max. |
Time 25 ¢J to peak temperature |
8 minutes max. |
|
Reflow Cycle: 3 cycles
The devices shall be allowed to cool at room ambient condition for five minutes minimum between reflow cycles.
Procedure 5: SAT 2
TEST RESULT: PASS
